IEEE Non-volatile Memory Technology Symposium

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CIES and Advantest Develop STT-MRAM Switching Current Measurement for Memory Test Systems
12 Nov 2018
Tohoku University's Center for Innovative Integrated Electronic Systems (CIES), led by Professor Tetsuo Endoh (Graduate School of Engineering at Tohoku University) has announced success on a collaboration between CIES and semiconductor test equipment supplier Advantest Corporation.

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